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[IEEE International Symposium on Electromagnetic Compatibility - Beijing, China (21-24 May 2002)] 2002 3rd International Symposium on Electromagnetic Compatibility - Assessment of the risk of damage due to lightning in the information systems
Wu Guifang,, Wen Xishan,, Chai Xuzheng,Year:
2002
Language:
english
DOI:
10.1109/elmagc.2002.1177429
File:
PDF, 224 KB
english, 2002