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[IEEE 2007 4th IEEE International Symposium on Biomedical Imaging: From Nano to Macro - Arlington, VA, USA (2007.04.12-2007.04.15)] 2007 4th IEEE International Symposium on Biomedical Imaging: From Nano to Macro - THREE-POINT METHOD FOR FAST AND ROBUST FIELD MAPPING FOR EPI GEOMETRIC DISTORTION CORRECTION
Aksit, Pelin, Derbyshire, John, Prince, JerryYear:
2007
Language:
english
DOI:
10.1109/isbi.2007.356808
File:
PDF, 502 KB
english, 2007