[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Electron Velocity Saturation and Probable Cross-Section Area of Leakage Current Path Post Soft Breakdown (SBD) in Ultrathin Gate Oxides
Xu, Ming-zhen, Tan, Chang-huaYear:
2006
Language:
english
DOI:
10.1109/icsict.2006.306700
File:
PDF, 99 KB
english, 2006