[IEEE 2010 10th IEEE International Conference on...

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[IEEE 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Shanghai, China (2010.11.1-2010.11.4)] 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - Characteristics of a new trench-oxide thin-film transistor and its 1T-DRAM applications

Chiu, Hsien-Nan, Lin, Jyi-Tsong, Eng, Yi-Chuen, Chang, Tzu-Feng, Sun, Chih-Hung, Lin, Po-Hiesh, Kuo, Chih-Hao, Chen, Hsuan-Hsu, Chen, Cheng-Hsin
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Year:
2010
Language:
english
DOI:
10.1109/icsict.2010.5667562
File:
PDF, 647 KB
english, 2010
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