[IEEE Technical Digest Summaries of papers presented at the Conference on Lasers and Electro-Optics Conference Edition. 1998 Technical Digest Series, Vol.6 - San Francisco, CA, USA (1998.5.3-1998.5.8)] Technical Digest. Summaries of Papers Presented at the Conference on Lasers and Electro-Optics. Conference Edition. 1998 Technical Digest Series, Vol.6 (IEEE Cat. No.98CH36178) - Bulk damage threshold and three-dimensional microstructuring of dielectrics using the self-focusing of ultrashort laser pulses