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[IEEE International Electron Devices Meeting. Technical Digest - San Francisco, CA, USA (8-11 Dec. 1996)] International Electron Devices Meeting. Technical Digest - A high performance 0.25 μm logic technology optimized for 1.8 V operation
Bohr, M., Ahmed, S.S., Ahmed, S.U., Bost, M., Ghani, T., Greason, J., Hainsey, R., Jan, C., Packan, P., Sivakumar, S., Thompson, S., Tsai, J., Yang, S.Year:
1996
Language:
english
DOI:
10.1109/iedm.1996.554112
File:
PDF, 390 KB
english, 1996