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[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - Test compression and logic BIST at your fingertips
Shianling Wu,, Laung-Terng Wang,, Jin Woo Cho,, Zhigang Jiang,, Boryau Sheu,Year:
2005
Language:
english
DOI:
10.1109/test.2005.1584111
File:
PDF, 318 KB
english, 2005