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[IEEE International Conference on Computer Aided Design (ICCAD) - San Jose, CA, USA (5-9 Nov. 2000)] IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140) - Impact of systematic spatial intra-chip gate length variability on performance of high-speed digital circuits
Orshansky, M., Milor, L., Pinhong Chen,, Keutzer, K., Chenming Hu,Year:
2000
Language:
english
DOI:
10.1109/iccad.2000.896452
File:
PDF, 717 KB
english, 2000