[IEEE 2011 50th IEEE Conference on Decision and Control and...

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[IEEE 2011 50th IEEE Conference on Decision and Control and European Control Conference (CDC-ECC 2011) - Orlando, FL, USA (2011.12.12-2011.12.15)] IEEE Conference on Decision and Control and European Control Conference - Control techniques for high-speed dynamic mode imaging in atomic force microscopes

Mohan, Gayathri, Lee, Chibum, Salapaka, Srinivasa
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Year:
2011
Language:
english
DOI:
10.1109/cdc.2011.6160734
File:
PDF, 351 KB
english, 2011
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