[IEEE 2011 IEEE 11th International Conference on...

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[IEEE 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO) - Portland, OR, USA (2011.08.15-2011.08.18)] 2011 11th IEEE International Conference on Nanotechnology - Modeling and minimizing variations of gate-all-around multiple-channel nanowire TFTs

Huang, Po-Chun, Chen, Lu-An, Chen, C. C., Sheu, Jeng-Tzong
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Year:
2011
Language:
english
DOI:
10.1109/nano.2011.6144567
File:
PDF, 544 KB
english, 2011
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