[IEEE 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO) - Portland, OR, USA (2011.08.15-2011.08.18)] 2011 11th IEEE International Conference on Nanotechnology - Modeling and minimizing variations of gate-all-around multiple-channel nanowire TFTs
Huang, Po-Chun, Chen, Lu-An, Chen, C. C., Sheu, Jeng-TzongYear:
2011
Language:
english
DOI:
10.1109/nano.2011.6144567
File:
PDF, 544 KB
english, 2011