[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - Noise Library Characterization for Large Capacity Static Noise Analysis Tools
Gyure, A., Kasnavi, A., Lo, S., Tehrani, P.F., Shu, W., Shahram, M., Wang, J.W., Zedja, J.Year:
2005
Language:
english
DOI:
10.1109/isqed.2005.85
File:
PDF, 241 KB
english, 2005