![](/img/cover-not-exists.png)
[IEEE 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) - College Station, TX, USA (2014.8.3-2014.8.6)] 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) - Supervised facial recognition based on multi-resolution analysis and feature alignment
Aldhahab, Ahmed, Atia, George, Mikhael, Wasfy B.Year:
2014
Language:
english
DOI:
10.1109/mwscas.2014.6908371
File:
PDF, 570 KB
english, 2014