[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - On Utilizing Test Cube Properties to Reduce Test Data Volume Further
Lin, Xijiang, Rajski, JansuzYear:
2012
Language:
english
DOI:
10.1109/ats.2012.41
File:
PDF, 290 KB
english, 2012