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[IEEE 8th International Symposium on Quality Electronic Design (ISQED'07) - San Jose, CA, USA (2007.03.26-2007.03.28)] 8th International Symposium on Quality Electronic Design (ISQED'07) - Power, Delay and Yield Analysis of BIST/BISR PLAs Using Column Redundancy

Alsaiari, Uthman, Saleh, Resve
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Year:
2007
Language:
english
DOI:
10.1109/isqed.2007.122
File:
PDF, 717 KB
english, 2007
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