[IEEE IEEE MTT-S International Microwave Symposium Digest,...

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[IEEE IEEE MTT-S International Microwave Symposium Digest, 2005. - Long Beach, CA, USA (12-17 June 2005)] IEEE MTT-S International Microwave Symposium Digest, 2005. - A new small signal model parameter extraction method applied to GaN devices

Jarndal, A., Kompa, G.
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Year:
2005
Language:
english
DOI:
10.1109/mwsym.2005.1516954
File:
PDF, 473 KB
english, 2005
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