[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - The construction and evaluation of behavioral models for microwave devices based on time-domain large-signal measurements
Schreurs, D., Wood, J., Tufillaro, N., Usikov, D., Barford, L., Root, D.E.Year:
2000
Language:
english
DOI:
10.1109/iedm.2000.904443
File:
PDF, 778 KB
english, 2000