[IEEE IECON 2009 - 35th Annual Conference of IEEE...

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[IEEE IECON 2009 - 35th Annual Conference of IEEE Industrial Electronics (IECON) - Porto, Portugal (2009.11.3-2009.11.5)] 2009 35th Annual Conference of IEEE Industrial Electronics - Yarn parameterization correlation using optical and capacitive sensors approaches

Carvalho, Vitor, Belsley, Michael, Vasconcelos, Rosa M., Soares, Filomena O.
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Year:
2009
Language:
english
DOI:
10.1109/iecon.2009.5414846
File:
PDF, 907 KB
english, 2009
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