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[IEEE 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Xi'an, China (2012.08.29-2012.09.1)] 2012 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Role of electric field distribution in local anodic oxidation
Hu, Kexiang, Wang, Qingkang, Wangyang, PeihuaYear:
2012
Language:
english
DOI:
10.1109/3m-nano.2012.6472980
File:
PDF, 988 KB
english, 2012