[IEEE 2007 IEEE Radiation Effects Data Workshop - (2007.07.23-2007.07.27)] 2007 IEEE Radiation Effects Data Workshop - Low Dose Rate Testing of the Intersil IS1009RH Hardened Voltage Reference and ISL72991RH Negative Low Dropout Regulator
van Vonno, N. W., Gill, J. S.Year:
2007
Language:
english
DOI:
10.1109/redw.2007.4342548
File:
PDF, 222 KB
english, 2007