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Scanning-laser-microscope measurements of minority-carrier diffusion length and surface recombination velocity in polycrystalline silicon
Damaskinos, S., Dixon, A. E.Volume:
63
Language:
english
Journal:
Canadian Journal of Physics
DOI:
10.1139/p85-141
Date:
June, 1985
File:
PDF, 325 KB
english, 1985