[IEEE 2013 35th International Conference on Software Engineering (ICSE) - San Francisco, CA, USA (2013.05.18-2013.05.26)] 2013 35th International Conference on Software Engineering (ICSE) - Transfer defect learning
Nam, Jaechang, Pan, Sinno Jialin, Kim, SunghunYear:
2013
Language:
english
DOI:
10.1109/icse.2013.6606584
File:
PDF, 396 KB
english, 2013