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[IEEE 1996 IEEE MTT-S International Microwave Symposium Digest - San Francisco, CA, USA (17-21 June 1996)] 1996 IEEE MTT-S International Microwave Symposium Digest - New aspects concerning the bias and temperature dependence of intrinsic noise generators in extracted FET models
Lardizabal, S.M., Dunleavy, L.P., Boudiaf, A.Volume:
3
Year:
1996
Language:
english
DOI:
10.1109/mwsym.1996.512180
File:
PDF, 339 KB
english, 1996