[IEEE 2009 67th Annual Device Research Conference (DRC) - University Park, PA, USA (2009.06.22-2009.06.24)] 2009 Device Research Conference - High-temperature electro-optical degradation of DC-Aged InGaN based high power GaN LEDs
Moon, Seong Min, Chae, Seung Wan, Kwak, Joon SeopYear:
2009
Language:
english
DOI:
10.1109/drc.2009.5354857
File:
PDF, 184 KB
english, 2009