[IEEE 2005 IEEE International Conference on Information Acquisition - Hong Kong and Macau, China (June 27 - July 3, 2005)] 2005 IEEE International Conference on Information Acquisition - Analysis of depth from defocus measurements for micro-imaging and 3D micro-visual reconstruction
Yangjie Wei,, Zaili Dong,, Lei Miao,, Wen J. Li,Year:
2005
Language:
english
DOI:
10.1109/icia.2005.1635107
File:
PDF, 542 KB
english, 2005