[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Using dynamic shift to reduce test data volume in high-compression designs
Lin, Xijiang, Kassab, Mark, Rajski, JanuszYear:
2014
Language:
english
DOI:
10.1109/ets.2014.6847822
File:
PDF, 411 KB
english, 2014