[IEEE IEEE InternationalElectron Devices Meeting, 2005....

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[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - High-speed blue-, red-, and infrared-sensitive photodiode integrated in a 0.35 μm SiGe:C-BiCMOS process

Meinhardt, G., Kraft, J., Loffler, B., Enichlmair, H., Rohrer, G., Wachmann, E., Schrems, M., Swoboda, R., Seidl, C., Zimmermann, H.
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Year:
2005
Language:
english
DOI:
10.1109/iedm.2005.1609477
File:
PDF, 413 KB
english, 2005
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