A Basis for Setting Burn-in Yield Criteria

IEEE Design & Test of Computers 1985 / 06 Vol. 2; Iss. 3

A Basis for Setting Burn-in Yield Criteria

Van Den Heuvel, Anthony, Khory, Noshir
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Volume:
2
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.1985.294735
Date:
June, 1985
File:
PDF, 5.89 MB
english, 1985
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