![](/img/cover-not-exists.png)
A Basis for Setting Burn-in Yield Criteria
Van Den Heuvel, Anthony, Khory, NoshirVolume:
2
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/mdt.1985.294735
Date:
June, 1985
File:
PDF, 5.89 MB
english, 1985