[IEEE 2009 International Conference on Test and Measurement...

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[IEEE 2009 International Conference on Test and Measurement (ICTM) - Hong Kong, Hong Kong (2009.12.5-2009.12.6)] 2009 International Conference on Test and Measurement - Evaluation analysis of university student scholarship

Xinghua Ma,, Fengtong Yue,, Qiuna Zhang,, Yuhuan Cui,, Jingguo Qu,
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Year:
2009
Language:
english
DOI:
10.1109/ictm.2009.5413089
File:
PDF, 654 KB
english, 2009
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