Effect of Ultrasonic Treatment on the Defect Structure of the Si-SiO2 System
Kropman, Daniel, Dolgov, Sergei, Onufrijevs, Pavel, Dauksta, EdvinsVolume:
205-206
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/ssp.205-206.352
Date:
October, 2013
File:
PDF, 368 KB
english, 2013