[IEEE 2009 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT) - Hsinchu, Taiwan (2009.08.31-2009.09.2)] 2009 IEEE International Workshop on Memory Technology, Design, and Testing - Impacts of Contact Resistance and NBTI/PBTI on SRAM with High-? Metal-Gate Devices
Yang, Hao-I, Chuang, Ching-Te, Hwang, WeiYear:
2009
Language:
english
DOI:
10.1109/mtdt.2009.25
File:
PDF, 932 KB
english, 2009