[IEEE 2010 IEEE Sarnoff Symposium - Princeton, NJ, USA...

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[IEEE 2010 IEEE Sarnoff Symposium - Princeton, NJ, USA (2010.04.12-2010.04.14)] 2010 IEEE Sarnoff Symposium - On the modeling of delay and burstiness for calculating throughput

Mahmood, Kashif, Jiang, Yuming, Eshete, Addisu T.
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Year:
2010
Language:
english
DOI:
10.1109/sarnof.2010.5469717
File:
PDF, 143 KB
english, 2010
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