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[IEEE 2010 IEEE International Conference on Robotics and Automation (ICRA 2010) - Anchorage, AK (2010.05.3-2010.05.7)] 2010 IEEE International Conference on Robotics and Automation - Combined nanorobotic AFM/SEM system as novel toolbox for automated hybrid analysis and manipulation of nanoscale objects
Mick, U, Eichhorn, V, Wortmann, T, Diederichs, C, Fatikow, SYear:
2010
Language:
english
DOI:
10.1109/robot.2010.5509414
File:
PDF, 1.47 MB
english, 2010