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[IEEE 2005 International Conference On Simulation of Semiconductor Processes and Devices - Tokyo, Japan (2005.09.3-2005.09.3)] 2005 International Conference On Simulation of Semiconductor Processes and Devices - Simulation Analysis of Series Resistance for SOI MOSFET in Nanometer Regime

Xinlin Wang,, Oldiges, P., Bryant, A., Jin Cai,, Qiqing Ouyang,, Rim, K.
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Year:
2005
Language:
english
DOI:
10.1109/sispad.2005.201517
File:
PDF, 1.52 MB
english, 2005
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