[IEEE 2013 15th European Conference on Power Electronics and Applications (EPE) - Lille, France (2013.09.2-2013.09.6)] 2013 15th European Conference on Power Electronics and Applications (EPE) - Power cycling ageing tests at 200°C of SiC assemblies for high temperature electronics
Ibrahim, Ali, Khatir, ZoubirYear:
2013
Language:
english
DOI:
10.1109/epe.2013.6634647
File:
PDF, 2.11 MB
english, 2013