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[IEEE 2014 International Semiconductor Conference (CAS) - Sinaia, Romania (2014.10.13-2014.10.15)] 2014 International Semiconductor Conference (CAS) - Thermographic analysis with enhanced emissivity
Varsescu, D., Ilian, V. E., Bazu, M.Year:
2014
Language:
english
DOI:
10.1109/smicnd.2014.6966462
File:
PDF, 816 KB
english, 2014