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[IEEE IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science - Monterey, CA, USA (2005.06.20-2005.06.23)] IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science - Development of Optical Diagnostics for Bismuth Plasma Propulsion Devices
Scharfe, David B., Cappelli, Mark A.Year:
2005
Language:
english
DOI:
10.1109/plasma.2005.359169
File:
PDF, 763 KB
english, 2005