[IEEE Proceedings of IEEE International Electron Devices Meeting - San Francisco, CA, USA (1989.12.3-1989.12.6)] International Technical Digest on Electron Devices Meeting - All-silicon internal barrier detectors: a voltage-tunable LWIR staring focal plane technology
Temofonte,, Braggins,, Emtage,, Bevan,, Thomas,, Nathanson,, Halvis,, Shiskowski,, Wilson,, McCann,Year:
1992
Language:
english
DOI:
10.1109/iedm.1992.307323
File:
PDF, 339 KB
english, 1992