![](/img/cover-not-exists.png)
[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - The impact of uniaxial strain on low frequency noise of nanoscale PMOSFETs with e-SiGe and i-SiGe source/drain
Yeh, Kuo-Liang, Hong, Wei-Lun, Guo, Jyh-ChyurnYear:
2010
Language:
english
DOI:
10.1109/mwsym.2010.5517095
File:
PDF, 58 KB
english, 2010