![](/img/cover-not-exists.png)
[IEEE 2008 IEEE Nuclear Science Symposium and Medical Imaging conference (2008 NSS/MIC) - Dresden, Germany (2008.10.19-2008.10.25)] 2008 IEEE Nuclear Science Symposium Conference Record - Study of surface roughness of CsI:Tl crystals treated by various abrasives
Kilimchuk, I.V., Tarasov, V.A., Alameda, J.M.Year:
2008
Language:
english
DOI:
10.1109/nssmic.2008.4774601
File:
PDF, 1.26 MB
english, 2008