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[IEEE 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Minneapolis, MN (2013.05.6-2013.05.9)] 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Interferometric technique for scanning near-field microwave microscopy applications
Bakli, H., Haddadi, K., Lasri, T.Year:
2013
Language:
english
DOI:
10.1109/i2mtc.2013.6555703
File:
PDF, 402 KB
english, 2013