Studies of ferroelectric heterostructure thin films,...

Integrated Ferroelectrics 1999 / 11 Vol. 27; Iss. 1-4

Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques

Auciello, Orlando, Krauss, Alan R., Im, Jaemo, Dhote, Anil, Gruen, Dieter M., Aggarwal, Sanjeev, Ramesh, Ramamoorthy, Irene, Eugene A., Gao, Ying, Mueller, Alex H.
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Volume:
27
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589908228460
Date:
November, 1999
File:
PDF, 1.02 MB
english, 1999
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