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[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Thermal analysis and model identification techniques for a logic + WIDEIO stacked DRAM test chip
Beneventi, Francesco, Bartolini, Andrea, Vivet, Pascal, Dutoit, Denis, Benini, LucaYear:
2014
Language:
english
DOI:
10.7873/date.2014.345
File:
PDF, 335 KB
english, 2014