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[IEEE 2013 Third International Conference on Instrumentation, Measurement, Computer, Communication and Control (IMCCC) - Shenyang, China (2013.9.21-2013.9.23)] 2013 Third International Conference on Instrumentation, Measurement, Computer, Communication and Control - Contour Matching Based on Local Curvature Scale
Yan, Zhao, Gui-Li, XuYear:
2013
Language:
english
DOI:
10.1109/imccc.2013.376
File:
PDF, 359 KB
english, 2013