![](/img/cover-not-exists.png)
[IEEE 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Chengdu , China (2009.04.28-2009.04.29)] 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis - Synthetic Test Equipment Using PXI Based Instrumentation
Meng, Jinsong, Li, Tianyi, Xie, YongleYear:
2009
Language:
english
DOI:
10.1109/cas-ictd.2009.4960884
File:
PDF, 292 KB
english, 2009