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[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Scalability of SOI technology into 0.13 μm 1.2 V CMOS generation
Leobandung, E., Sherony, M., Sleight, J., Bolam, R., Assaderaghi, F., Wu, S., Schepis, D., Ajmera, A., Rausch, W., Davari, B., Shahidi, G.Year:
1998
Language:
english
DOI:
10.1109/iedm.1998.746384
File:
PDF, 358 KB
english, 1998