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[IEEE ACM/IEEE SC 2005 Conference (SC'05) - Seattle, WA, USA (12-18 Nov. 2005)] ACM/IEEE SC 2005 Conference (SC'05) - Using Dynamic Tracing Sampling to Measure Long Running Programs
Odom, J., Hollingsworth, J.K., DeRose, L., Ekanadham, K., Sbaraglia, S.Year:
2005
Language:
english
DOI:
10.1109/sc.2005.77
File:
PDF, 295 KB
english, 2005