CDF run IIb silicon: design and testing

IEEE Transactions on Nuclear Science 2004 / 10 Vol. 51; Iss. 5

CDF run IIb silicon: design and testing

Lu, R.-S., Akimoto, T., Aoki, M., Azzi, P., Bacchetta, N., Behari, S., Benjamin, D., Bisello, D., Bolla, G., Bortoletto, D., Busetto, G., Cabrera, S., Canepa, A., Cardoso, G., Chertok, M., Ciobanu, C.
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Volume:
51
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2004.835715
Date:
October, 2004
File:
PDF, 1.07 MB
english, 2004
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