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[IEEE CAS 2001 International Semiconductor Conference - Sinaia, Romania (9-13 Oct. 2001)] 2001 International Semiconductor Conference. CAS 2001 Proceedings (Cat. No.01TH8547) - Investigation on operation of silicon power devices in the breakdown region of electrical characteristic
Obreja, V.V.N.Year:
2001
Language:
english
DOI:
10.1109/smicnd.2001.967511
File:
PDF, 302 KB
english, 2001