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[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - Mapping timed automata to B
Ayoub, Anaheed, Wahba, Ayman, Sheirah, MohamedYear:
2008
Language:
english
DOI:
10.1109/idt.2008.4802508
File:
PDF, 167 KB
english, 2008