[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 - Orlando, FL, USA (28-30 Sept. 1999)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) - Interferometric temperature mapping during ESD stress and failure analysis of smart power technology ESD protection devices

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